Mezz card rad summary • Brief summary with links to backup documents &bull 25 July 2007
"Simulated Radiation Levels and Current Test Status for ATLAS MDT Front-End Electronics" note from April 2003, with detailed, board-by-board analysis of radiation levels.
We must tested all components of the front-end electronics to meet the ATLAS Policy. The radiation levels are specified in the MDT PDR Report of 22 Feb 2001. This page will document the testing of the voltage regulators and LVDS drivers/receivers on the mezzanine PCB. Other active components which are being tested elsewhere include the MDT-ASD chip (Christoph Posch at CERN) and the AMT-2 chip (Yasuo Arai at KEK).
The devices we have tested are:
The basic test strategy was to operate the regulator under load conditions similar to those in normal operation, and to monitor the regulator output for voltage changes and transients. The regulator input current was also monitored. The power was cycled off and on periodically during testing as necessary to clear any latch-up conditions.
Results: No single-event effects were seen. Most devices failed eventually due to apparently cumulative effects of either total ionizing dose or accompanying neutrons.
|SEE Test Results|
|Device||No Devices Tested||SEE Seen||Total protons/cm^2|
|Preliminary TID Test Results|
|Device|| Number of |
| Failure Dose |
Muon RPC Radiation Assurance
ESA Radiation Effects page
NASA Goddard Radiation Test Data
Radiation Effects page
NASA JPL Radiation Effects Database
ERRIC (Electronics Radiation Response Information Center) Main page